The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 20, 2005
Filed:
Apr. 05, 2002
David Beverly, Alden, NY (US);
David Beverly, Alden, NY (US);
Reichert, Inc., Depew, NY (US);
Abstract
An alignment system for an ophthalmic instrument comprises an optical axis along which an operator can directly view the patient's eye and the patient can fixate on a dark fixation target surrounded by a bright background that helps to illuminate the eye for operator viewing. A position detection system utilizing stored geometrical relationships determined by multiple regression during instrument calibration computes X-Y-Z alignment status of the instrument relative to a patient's eye based on local x-y position information from a pair of lateral detectors receiving corneally reflected light from a corresponding pair of lateral light sources. A heads-up display image is provided along an optical axis of the instrument for supplying instructive cues to an operator for moving the instrument to achieve alignment based on signal information from the position detection system, whereby the operator sees both a direct macro-image of the patient's eye and the display image. The alignment system is particularly suitable for use in hand-held ophthalmic instruments.