The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 20, 2005
Filed:
May. 14, 2002
Daniel J. Vavrick, Fredericksburg, VA (US);
Daniel J. Vavrick, Fredericksburg, VA (US);
The United States of America as represented by the Secretary of the Navy, Washington, DC (US);
Abstract
A multiple fragment impact test specimen, and a method for using it in multiple fragment impact tests against a target, is disclosed. The test specimen comprises two or more fragments fixed to one or more connecting members so that the fragments are held at a fixed distance apart during their flight to a target. The orientation and speed of the fragments at the moment of impacting the target are measured and the measurements are used to calculate the exact spacing and time delay between the individual fragment impacts. An experimenter can control the range of fragment spacings and time delays for a series of tests by choosing the lengths of the connecting members and thereby fixing the relative distances between the fragments.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile