The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 13, 2005
Filed:
Aug. 06, 2002
Hans-dieter Oberle, Puchheim, DE;
Sebastian Sattler, München, DE;
Hans-Dieter Oberle, Puchheim, DE;
Sebastian Sattler, München, DE;
Infineon Technologies AG., Munich, DE;
Abstract
In order to test the input and output drivers of a circuit, in particular an integrated semiconductor circuit, a method and apparatus is provided to connect the input or output drivers assigned to individual signal connections of the circuit to be tested in series to a ring oscillator or to an open chain with the oscillation of the ring oscillator or the delay time being evaluated. By providing appropriate controllable switches, the configuration of the ring oscillator or the chain can be altered variably depending on the input or output drivers to be tested respectively. In this way an 'at-speed' and 'leakage' test of all input and output drivers, including the external signal connections, are possible with all of these having to be connected to a rapid test unit.