The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 13, 2005

Filed:

Nov. 07, 2003
Applicants:

Satoru Watanabe, Susono, JP;

Akira Ohata, Mishima, JP;

Masato Ehara, Susono, JP;

Inventors:

Satoru Watanabe, Susono, JP;

Akira Ohata, Mishima, JP;

Masato Ehara, Susono, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B013/02 ;
U.S. Cl.
CPC ...
Abstract

The present invention is directed to generate an adaptive value in a short time. An adaptive value generating program has an adaptive procedure control program and a DOE tool. The DOE tool is a general statistical processing tool. The adaptive value procedure generating program functions as an interface between a measuring apparatus and the DOE tool. In a data obtaining process, the adaptive value procedure generating program automatically determines a method of selecting a measurement point and passes the result to the DOE tool. Selection of an approximation function and selection of an optimization method are automated. Further, evaluation of a final approximation expression and determination of confirmation data are also automated.


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