The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 13, 2005
Filed:
Nov. 11, 2003
Jiang Hsieh, Brookfield, WI (US);
Edward Henry Chao, Oconomowoc, WI (US);
Brian James Grekowicz, Waukesha, WI (US);
Jean-baptiste Thibault, Milwaukee, WI (US);
Jiang Hsieh, Brookfield, WI (US);
Edward Henry Chao, Oconomowoc, WI (US);
Brian James Grekowicz, Waukesha, WI (US);
Jean-Baptiste Thibault, Milwaukee, WI (US);
GE Medical Systems Global Technology Company, LLC, Waukesha, WI (US);
Abstract
Some configurations of the present invention provide a method for reconstructing an image of an object of a computed tomographic imaging system having a detector array and a radiation source, wherein an arc of the detector array is not concentric to a focal spot of the radiation source. The method includes scanning the object with the computed tomographic imaging system to obtain a fan beam dataset, rebinning the fan beam dataset into a set of parallel datasets; and reconstructing an image utilizing the set of parallel datasets.