The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 13, 2005
Filed:
Jun. 12, 2002
Applicants:
Masayuki Horiguchi, Nagoya, JP;
Nobuaki Kitajima, Tokyo, JP;
Noriaki Kanazawa, Tokyo, JP;
Inventors:
Assignee:
Kabushiki Kaisha Topcon, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B021/00 ;
U.S. Cl.
CPC ...
Abstract
Disclosed is a microscope for operation. This microscope for operation comprises a front lens 15 disposed between an eye 8 to be operated and an objective 14. The front lens collects an illuminating light P to guide the collected light within the eye for illuminating an interior of the eye. An operator performs an operation within the eye through an eyepiece 39. A refracting power of the front lens 15 is within a range of 30D to 50D.