The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 13, 2005
Filed:
Dec. 01, 2000
Applicants:
Michael Borchardt, Neuenkirchen, DE;
Frank Wendzinski, Telgte, DE;
Dorthe Eikermann, Münster, DE;
Inventors:
Assignee:
Institut Für Chemo-Und Biosensorik Münster E.V., Münster, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B011/06 ;
U.S. Cl.
CPC ...
Abstract
Disclosed is a method for quality control of a material layer, which involves providing the material of the layer with an agent for absorbing an electromagnetic radiation, irradiating the surface of the layer with an electromagnetic radiation, and measuring the amount of light emitted by the material layer, for example, reflected radiation or fluorescence radiation.