The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 13, 2005
Filed:
Apr. 04, 2003
James P. Hubner, Gainesville, FL (US);
Peter G. Ifju, Newberry, FL (US);
Kirk S. Schanze, Gainesville, FL (US);
Shujun Jiang, Xian, CN;
Yao Liu, Gainesville, FL (US);
David A. Jenkins, Gainesville, FL (US);
James P. Hubner, Gainesville, FL (US);
Peter G. Ifju, Newberry, FL (US);
Kirk S. Schanze, Gainesville, FL (US);
Shujun Jiang, Xian, CN;
Yao Liu, Gainesville, FL (US);
David A. Jenkins, Gainesville, FL (US);
Resesarch Foundation, Inc., Gainesville, FL (US);
Visteon Global Technologies, Inc., Dearborn, MI (US);
Abstract
A method and apparatus for measuring strain on a surface of a substrate utilizes a substrate surface coated with at least one coating layer. The coating layer provides both luminescence and photoelasticity. The coating layer is illuminated with excitation light, wherein longer wavelength light is emitted having a polarization dependent upon stress or strain in the coating. At least one characteristic of the emitted light is measured, and strain (if present) on the substrate is determined from the measured characteristic.