The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 13, 2005
Filed:
Jun. 28, 2002
John Michael Snyder, Redmond, WA (US);
John Turner Whitted, Carnation, WA (US);
William Thomas Blank, Bellevue, WA (US);
Kirk Olynyk, Redmond, WA (US);
John Michael Snyder, Redmond, WA (US);
John Turner Whitted, Carnation, WA (US);
William Thomas Blank, Bellevue, WA (US);
Kirk Olynyk, Redmond, WA (US);
Microsoft Corporation, Redmond, WA (US);
Abstract
Systems and methods are provided for variable source rate sampling in connection with image rendering, which accumulate and resolve over all samples forward mapped to each pixel bin. In accordance with the invention, the textured surface to be rendered is sampled, or oversampled, at a variable rate that reflects variations in frequency among different regions, taking into account any transformation that will be applied to the surface prior to rendering and the view parameters of the display device, thus ensuring that each bin of the rendering process receives at least a predetermined minimum number of samples. A variety of image processing applications are contemplated wherein variable rate source sampling, and accumulation and resolution of forward mapped point samples can be applied, ranging from 3-D graphics applications to applications wherein images recorded in a recording/storage environment are mapped to the arbitrary requirements of a display environment.