The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 13, 2005
Filed:
Mar. 11, 2002
Mark E. Pascual, San Jose, CA (US);
Michael G. Lavelle, Saratoga, CA (US);
Michael F. Deering, Los Altos, CA (US);
Nandini Ramani, Saratoga, CA (US);
Mark E. Pascual, San Jose, CA (US);
Michael G. Lavelle, Saratoga, CA (US);
Michael F. Deering, Los Altos, CA (US);
Nandini Ramani, Saratoga, CA (US);
Sun Microsystems, Inc., Santa Clara, CA (US);
Abstract
A system and method are disclosed for utilizing a Z slope test to select polygons that may be candidates for multiple storage methods. The method may calculate the absolute Z slope from vertex data and compare the calculated value with a specified threshold value. In some embodiments, for polygons that have an absolute Z slope less than the threshold value, parameter values may be rendered for only one sample position of multiple neighboring sample positions. The parameter values rendered for the one sample position may then be stored in multiple memory locations that correspond to the multiple neighboring sample positions. In some embodiments, storing parameter values in multiple memory locations may be achieved in a single write transaction. In some embodiments, utilization of the Z slope test method may be subject to user input and in other embodiments may be a dynamic decision controlled by the graphics system.