The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6943739 B1

PDF
Full Text
Expired
Date of Patent:
Sep. 13, 2005

Filed:

Mar. 22, 2004
Applicants:

Seppo Rousu, Oulu, FI;

Kari Moilanen, Oulu, FI;

Inventors:

Seppo Rousu, Oulu, FI;

Kari Moilanen, Oulu, FI;

Assignee:

Nokia Corporation, Espoo, FI;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01Q001/24 ; G01R029/10 ;
U.S. Cl.
CPC ...
Abstract

A device that has an antenna and an internal RF circuit is connected by an electrical conductor that has a first portion coupled to the RF circuit and an opposed, flexibly resilient second portion. The second portion defines a contact point and a testing point. The contact point is normally electrically coupled to the antenna by a bias in the second portion. When a biasing force such as a RF testing probe exerts force on the testing point through an aperture of a device housing, the normal bias of the second portion is overcome and contact is temporarily interrupted between the antenna and the contact point. The RF probe is placed in electrical contact with the RF circuit by contact with the testing point, which may be directly when a cover over the aperture is removable, or via a conductive pathway imposed through a flexible membrane that is fixed to the housing as a cover over the aperture.


Find Patent Forward Citations

Rousu, Seppo. (2005). Method and apparatus for testing rf modules (U.S. Patent No. 6943739). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6943739

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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