The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 13, 2005
Filed:
Mar. 31, 2004
Applicants:
Naoko Pia Sanda, Chappaqua, NY (US);
Steven H. Voldman, South Burlington, VT (US);
Alan J. Weger, Mohegan Lake, NY (US);
Inventors:
Naoko Pia Sanda, Chappaqua, NY (US);
Steven H. Voldman, South Burlington, VT (US);
Alan J. Weger, Mohegan Lake, NY (US);
Assignee:
International Business Machines Corporation, Armonk, NY (US);
Primary Examiner:
Int. Cl.
CPC ...
G01R031/26 ; G01R031/00 ; G06F017/50 ;
U.S. Cl.
CPC ...
Abstract
A method, system and apparatus are provided for operating a Picosecond Imaging Circuit Analysis (PICA)/high current source system include applying pulses from a high current pulse source to a Device Under Test (DUT). A photosensor detects photon emissions from the DUT. Signals from the photosensor are used to map photon emissions from the DUT. Data processing means relate the photon emissions to specific features of the DUT.