The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6943578 B1

PDF
Full Text
Expired
Date of Patent:
Sep. 13, 2005

Filed:

Mar. 31, 2004
Applicants:

Naoko Pia Sanda, Chappaqua, NY (US);

Steven H. Voldman, South Burlington, VT (US);

Alan J. Weger, Mohegan Lake, NY (US);

Inventors:

Naoko Pia Sanda, Chappaqua, NY (US);

Steven H. Voldman, South Burlington, VT (US);

Alan J. Weger, Mohegan Lake, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R031/26 ; G01R031/00 ; G06F017/50 ;
U.S. Cl.
CPC ...
Abstract

A method, system and apparatus are provided for operating a Picosecond Imaging Circuit Analysis (PICA)/high current source system include applying pulses from a high current pulse source to a Device Under Test (DUT). A photosensor detects photon emissions from the DUT. Signals from the photosensor are used to map photon emissions from the DUT. Data processing means relate the photon emissions to specific features of the DUT.


Find Patent Forward Citations

Sanda, Naoko. (2005). Method and application of pica (picosecond imaging circuit analysis) for high current pulsed phenomena (U.S. Patent No. 6943578). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6943578

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…