The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 13, 2005
Filed:
Oct. 07, 2003
Masahiko Matsuo, Fukuoka, JP;
Hideo Eda, Tokyo, JP;
Satoru Miyauchi, Tokyo, JP;
Abstract
A method for processing magnetic resonance imaging image information is characterized by that a magnetic resonance spectral intensity value is measured at each of a plurality of measuring points that are arranged at predetermined intervals along a lengthwise direction, a crosswise direction and a height direction on an object to be measured and several kinds of magnetic resonance imaging image information as a set of the magnetic resonance spectral intensity values measured at the measuring point are obtained by a plurality of different spectral intensity measuring methods with respect to the object to be measured, a magnetic resonance spectral intensity value at the predetermined position is obtained directly or indirectly from a measured results of the magnetic resonance spectral intensity values that is included in the magnetic resonance imaging image information and the predetermined position is set to be identical for all of the several varieties of magnetic resonance imaging image information with respect to each of the magnetic resonance imaging image information, and new image information at the predetermined position is derived by linear calculation between the spectral intensity values.