The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 13, 2005

Filed:

Apr. 19, 2002
Applicants:

Mark Bydder, London, GB;

Joseph V. Hajnal, London, GB;

David J. Larkman, London, GB;

Inventors:

Mark Bydder, London, GB;

Joseph V. Hajnal, London, GB;

David J. Larkman, London, GB;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V003/00 ;
U.S. Cl.
CPC ...
Abstract

In magnetic resonance imaging apparatus k-space data received from r.f. excitation pulses applied at successive phase-encode gradients and read-out while other gradients are applied is collected for individual coils of an array of r.f. receive coils. A processoruses the lines of data received by each r.f. receive coil at each phase-encode gradient together with reference spatial sensitivity profiles of each coil in a phase-encode direction represented in terms of spatial harmonics of a fundamental frequency one cycle of which corresponds with a desired field of view, to generate a set of phase-encode lines. These lines are converted to image space in Fourier Transform processorto produce an image for display on monitor


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