The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 13, 2005

Filed:

May. 07, 2002
Applicants:

Hrissi Samartzidou, Sunnyvale, CA (US);

Leah Turner, Sunnyvale, CA (US);

Steven Daniel, The Woodlands, TX (US);

Thomas Houts, Gilroy, CA (US);

Inventors:

Hrissi Samartzidou, Sunnyvale, CA (US);

Leah Turner, Sunnyvale, CA (US);

Steven Daniel, The Woodlands, TX (US);

Thomas Houts, Gilroy, CA (US);

Assignee:

Amersham Biosciences Corp., Piscataway, NJ (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
C07H021/02 ; C07H021/04 ; C12Q001/68 ;
U.S. Cl.
CPC ...
Abstract

Method of producing controls for use in gene expression analysis systems such as macroarrays, real-time PCR, northern blots, SAGE and microarrays. The controls are generated either from near-random sequence of DNA, or from inter- or intragenic regions of a genome. Ten specific control sequences are also disclosed. Also presented are methods of using these controls, including as negative controls, positive controls, and as calibrators of a gene expression analysis system.


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