The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 13, 2005

Filed:

Jun. 03, 2002
Applicant:

Shinsuke Suhara, Kariya, JP;

Inventor:

Shinsuke Suhara, Kariya, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B23P019/00 ;
U.S. Cl.
CPC ...
Abstract

A method of detecting a relative positioning error between a fiducial-mark imaging device and a substrate-holding device in an electric-component mounting system wherein the fiducial-mark imaging device is arranged to take an image of at least one substrate fiducial mark provided on a circuit substrate, and a positioning error of the circuit substrate as held by the substrate-holding device is detected on the basis of the image of the at least one substrate fiducial mark, so that an electric component is mounted by a mounting head onto the circuit substrate, so as to eliminate the positioning error of the circuit substrate, wherein the fiducial-mark imaging device is operated to take an image of at least one holding-device fiducial mark provided on the substrate-holding device, and the relative positioning error between the fiducial-mark imaging device and the substrate-holding device is detected on the basis of a positioning error of the image of the holding-device fiducial mark within an imaging area of the at least one fiducial-mark imaging device.


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