The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 06, 2005
Filed:
Oct. 01, 2003
Nital S. Patel, Plano, TX (US);
Rajesh Tiwari, Plano, TX (US);
Nital S. Patel, Plano, TX (US);
Rajesh Tiwari, Plano, TX (US);
Texas Instruments Incorporated, Dallas, TX (US);
Abstract
The present invention defines a versatile system for analyzing accuracy of industrial measurement data. The system of the present invention compiles measurements of a primary device characteristic from a representative cross-section of a population of devices. The system provides a modeling function, from which is determined a variance for each measurement—forming a corresponding compilation of variances (). The compilation of variances is evaluated for discontinuities (), to identify a discontinuity within the compilation of variances. This discontinuity is utilized to determine a demarcation () between accurate and inaccurate measurement data.