The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 06, 2005

Filed:

May. 25, 2001
Applicant:

Kevin Paul Demsky, Rochester, MN (US);

Inventor:

Kevin Paul Demsky, Rochester, MN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B010/08 ; H04B010/00 ;
U.S. Cl.
CPC ...
Abstract

A test method and apparatus are provided for testing parallel optical transceivers. Each of a plurality of channels of the parallel optical transceiver is connected in series. A predefined data pattern is applied to a first channel of the series connected plurality of channels. An output is detected from a last channel of the series connected plurality of channels and compared the applied predefined data pattern to identify operation of the parallel optical transceiver. An optical wrap plug and an electrical wrap plug are used for connecting in series the plurality of channels of the parallel optical transceiver. The optical wrap plug includes a plurality of optical connectors for respectively optically connecting each respective channel transmitter to a next respective channel receiver. The electrical wrap plug includes a plurality of electrical connectors for respectively electrically connecting a respective channel receiver to a corresponding respective channel transmitter.


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