The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 06, 2005
Filed:
Feb. 24, 2003
Masaki Yoshioka, Odawara, JP;
Kenichi Masuda, Odawara, JP;
Yuji Hata, Odawara, JP;
Takeshi Nakazawa, Odawara, JP;
Takayuki Umemoto, Odawara, JP;
Masaki Yoshioka, Odawara, JP;
Kenichi Masuda, Odawara, JP;
Yuji Hata, Odawara, JP;
Takeshi Nakazawa, Odawara, JP;
Takayuki Umemoto, Odawara, JP;
Hitachi Global Storage Technologies Japan, Ltd., Odawara, JP;
Abstract
When a head passes over a track with a projected item in a seek operation, the CPU delays a seek start time to conduct the seek by changing a period of time from a seek start position to a position of the track with a projected item. Or, the CPU conducts seek control by changing a speed table. Or, the CPU changes a sequence of items of a tag queue to obtain a seek locus not passing the projected item. By the control operation, a seek error due to thermal asperity is prevented and the head is not damaged. This also prevents appearance of a new projected item produced by contact between the magneto-resistive head and the projected item on the recording medium.