The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 06, 2005
Filed:
Nov. 18, 2003
Katsuyuki Abe, Hachioji, JP;
Katsuyuki Abe, Hachioji, JP;
Olympus Corporation, Tokyo, JP;
Abstract
A fluorescence observation apparatus includes a light source, an illumination optical system conducting irradiation light from the light source to a specimen, an aperture member provided in the illumination optical system, a first wavelength selective member, a light splitter deflecting the irradiation light to conduct the light to the specimen, an objective lens interposed between the light splitter and the specimen, a second wavelength selective member transmitting fluorescent light emanating from the specimen, a detecting device receiving the fluorescent light, and a projection optical system projecting the aperture member at the pupil position of the objective lens. In this case, the aperture member has a partial aperture through which part of the irradiation light passes, and the size of the partial aperture and the magnification of the projection optical system are set to satisfy the following Conditions:NA≦NA<NANA<nwhere NAis a numerical aperture derived from an angle made by a ray closest to the optical axis, of rays of light passing through the partial aperture, with the optical axis on the specimen, NA is the maximum numerical aperture of the objective lens, and n is the refractive index of a medium holding the specimen.