The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 06, 2005
Filed:
May. 20, 2004
Applicants:
Tomio Endo, Hidaka, JP;
Takeshi Yamagishi, Sagamihara, JP;
Katsuya Sadamori, Hachioji, JP;
Inventors:
Assignee:
Olympus Optical Co., Ltd., Tokyo, JP;
Primary Examiner:
Int. Cl.
CPC ...
G02B026/02 ;
U.S. Cl.
CPC ...
Abstract
In a pattern formation member adopted to a sectioning image observation apparatus which selectively irradiates a light from a light source to a sample, scans the sample, and acquires a light from the sample as a sectioning image, the pattern formation member comprises an irradiation section and a cutoff section, each of the irradiation section and the cutoff section is in a straight pattern, and these straight patterns are disposed alternatively.