The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 06, 2005
Filed:
Nov. 15, 2001
Arnaud Dubois, Les Ulis, FR;
Claude Boccara, Paris, FR;
Arnaud Dubois, Les Ulis, FR;
Claude Boccara, Paris, FR;
Centre National de la Recherche Scientific (C.N.R.S.), Paris Cedex, FR;
Abstract
A method and a device for interferential microscopic imaging of an object which comprises sending a light beam in each of the arms of a two-wave interferometer, one of the arms comprising the object to be analyzed. The phase is subjected to a sinusoidal modulation to a frequency f. The signal modulation results from mechanical oscillation of an assembly of elements of the interferometer. The interference signal (S) is integrated during the phase variation via a multichannel sensor. A computer enables to record the integrated interference signal obtained during each period fraction 1/n and to calculate, subsequently, the image of the object. The invention is potentially useful for characterizing thin layers, for controlling components in microelectronics, for reading data stored in volume (3D) and objects unstable in time; in biology and in vivo studies.