The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 06, 2005
Filed:
May. 04, 2004
Chong Han Lim, Kuala Lumpur, MY;
Heng Wai Seng, Bokit Katil, MY;
Chee Keong Low, Cheng, MY;
National Semiconductor Corporation, Santa Clara, CA (US);
Abstract
In a method of testing an IC, short circuits between adjacent I/Os are tested by grounding alternate rows in one step, and alternate columns in another step, and, if necessary including a third step of testing any inadequately tested I/Os by identifying inadequately tested I/Os and then testing these. The identifying may include performing an AND operation on the two I/O configurations of the two first steps, the grounded I/Os being defined as logic 0 and the tested I/Os as logic 1. The third step involves grounding all power supply and all ground pins of the IC and testing the remaining I/Os that were inadequately tested in both of the first two steps.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile