The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 06, 2005
Filed:
May. 28, 2002
Alexander Alekseevich Makarov, Cheadle Hulme, GB;
Stephen Charles Davis, Macclesfield, GB;
Richard Whitney Stresau, Sydney, AU;
Kevin Lionel Hunter, Glenhaven, AU;
Wayne Leslie Sheils, Baulkham Hills, AU;
Alexander Alekseevich Makarov, Cheadle Hulme, GB;
Stephen Charles Davis, Macclesfield, GB;
Richard Whitney Stresau, Sydney, AU;
Kevin Lionel Hunter, Glenhaven, AU;
Wayne Leslie Sheils, Baulkham Hills, AU;
Thermo Finnigan LLC, San Jose, CA (US);
Abstract
An ion detection arrangementfor a time-of-flight (TOF) mass spectrometerincludes a beam splitter formed as a meshat the end of the TOF acceleration and detection chamber. Ions enter the detection arrangement through a common entrance window and are then divided by the beam splitter. Those ions striking the meshgenerate secondary electronswhich are detected by a microchannel plate forming a first detector. Those ions passing through the ion beam splitter are detected directly by a second detectoralso formed from a microchannel plate. The two detectors are each connected to a corresponding data acquisition systemand the data obtained by each are combined to generate a mass spectrum. The problems of detector saturation are thus avoided.