The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 06, 2005
Filed:
Feb. 24, 2003
Oliver Hamann, Sammamish, WA (US);
Oliver Hamann, Sammamish, WA (US);
Laser Sensor Technology, Inc., Redmond, WA (US);
Abstract
An apparatus for validating the operation of an optical scanning system is provided. The apparatus includes one or more scanning illumination beams () for scanning an object, and one or more observing beams that comprise light scattered by the object being scanned, which inversely follow the path of the illumination beams. The apparatus further includes a reflector structure () arranged to reflect both the illuminating beams and observing beams scattered by a reference target () for a portion of each scan (e.g., a scan may be a 360-degree scan in the case of a circular scanning system). The apparatus still further includes the reference target () arranged to be scanned by the illumination beams reflected by the reflector structure during said portion of each scan. Light scattered by the reference target is received as the observing beams, and their optical properties are continuously monitored to validate the proper operation of the optical scanning system.