The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 30, 2005
Filed:
Mar. 07, 2000
Mark R. Bilak, Burlington, VT (US);
Joseph M. Forbes, Westford, VT (US);
Curt Guenther, Essex Junction, VT (US);
Michael J. Maloney, Waterbury Center, VT (US);
Michael D. Maurice, Jericho, VT (US);
Timothy J. O'gorman, Williston, VT (US);
Regis D. Parent, Underhill, VT (US);
Jeffrey S. Zimmerman, Hinesburg, VT (US);
Mark R. Bilak, Burlington, VT (US);
Joseph M. Forbes, Westford, VT (US);
Curt Guenther, Essex Junction, VT (US);
Michael J. Maloney, Waterbury Center, VT (US);
Michael D. Maurice, Jericho, VT (US);
Timothy J. O'Gorman, Williston, VT (US);
Regis D. Parent, Underhill, VT (US);
Jeffrey S. Zimmerman, Hinesburg, VT (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method for creating a guardband that incorporates statistical models for test environment, system environment, tester-to-system offset and reliability into a model and then processes a final guardband by factoring manufacturing process variation and quality against yield loss.