The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 30, 2005

Filed:

Feb. 19, 2002
Applicants:

Spencer Gold, Pepperell, MA (US);

Claude R. Gauthier, Fremont, CA (US);

Kenneth House, Arlington, MA (US);

Kamran Zarrineh, Nashua, NH (US);

Inventors:

Spencer Gold, Pepperell, MA (US);

Claude R. Gauthier, Fremont, CA (US);

Kenneth House, Arlington, MA (US);

Kamran Zarrineh, Nashua, NH (US);

Assignee:

Sun Microsystems, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01K001/08 ;
U.S. Cl.
CPC ...
Abstract

A controller and method are provided for monitoring and controlling a temperature of an integrated circuit to inhibit damage from a thermal problem. The controller and method allow for individual temperature thresholds for each of one or more temperature sensors. Digital filtering of values received from temperature sensors is also provided. A variety of actions can be selected for execution upon a determination of an over-temperature condition of the integrated circuit, including assert an over-temperature pin, assert an over-temperature bit in an error register of said controller, assert an over-temperature bit in an error register of said microprocessor, issue an over-temperature interrupt to a service bus of said integrated circuit, cause a trap, slow an operating frequency of said integrated circuit, stop said integrated circuit, and do nothing.


Find Patent Forward Citations

Loading…