The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 30, 2005
Filed:
Oct. 31, 2002
Alex Fishman, Sunnyvale, CA (US);
Konstantinos G. Haritos, Saratoga, CA (US);
Paul Sung, Saratoga, CA (US);
Dmitri Bannikov, Mountain View, CA (US);
Serguei Dorofeev, Sunnyvale, CA (US);
Alex Fishman, Sunnyvale, CA (US);
Konstantinos G. Haritos, Saratoga, CA (US);
Paul Sung, Saratoga, CA (US);
Dmitri Bannikov, Mountain View, CA (US);
Serguei Dorofeev, Sunnyvale, CA (US);
Finisar Corporation, Sunnyvale, CA (US);
Abstract
Systems and methods for testing bit processing capacities of electronic devices and for reducing or eliminating jitter that compromises the ability of electronic devices to perform this task. Embodiments include circuitry and a methodology for locating and employing a data signal delay—in conjunction with a latch—to reduce or eliminate jitter from serial encoded data generated by a serializer/deserializer. The data signal delay ensures that the latch latches a state of the serial encoded data at a position within a data signal cycle of minimum jitter.