The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 30, 2005
Filed:
May. 21, 2004
Irving C. Statler, Mountain View, CA (US);
Thomas A. Ferryman, Richland, WA (US);
Brett G. Amidan, Kennewick, WA (US);
Paul D. Whitney, Richland, WA (US);
Amanda M. White, Kennewick, WA (US);
Alan R. Willse, Richland, WA (US);
Scott K. Cooley, Kennewick, WA (US);
Joseph Griffith Jay, Corvallis, OR (US);
Robert E. Lawrence, Los Altos, CA (US);
Chris Mosbrucker, Corvallis, OR (US);
Loren J. Rosenthal, Los Gatos, CA (US);
Robert E. Lynch, San Carlos, CA (US);
Thomas R. Chidester, Mountain View, CA (US);
Gary L. Prothero, Corvallis, OR (US);
Adi L. Andrei, Corvallis, OR (US);
Timothy P. Romanowski, Corvallis, OR (US);
Daniel E. Robin, Corvallis, OR (US);
Jason W. Prothero, Corvallis, OR (US);
Irving C. Statler, Mountain View, CA (US);
Thomas A. Ferryman, Richland, WA (US);
Brett G. Amidan, Kennewick, WA (US);
Paul D. Whitney, Richland, WA (US);
Amanda M. White, Kennewick, WA (US);
Alan R. Willse, Richland, WA (US);
Scott K. Cooley, Kennewick, WA (US);
Joseph Griffith Jay, Corvallis, OR (US);
Robert E. Lawrence, Los Altos, CA (US);
Chris Mosbrucker, Corvallis, OR (US);
Loren J. Rosenthal, Los Gatos, CA (US);
Robert E. Lynch, San Carlos, CA (US);
Thomas R. Chidester, Mountain View, CA (US);
Gary L. Prothero, Corvallis, OR (US);
Adi L. Andrei, Corvallis, OR (US);
Timothy P. Romanowski, Corvallis, OR (US);
Daniel E. Robin, Corvallis, OR (US);
Jason W. Prothero, Corvallis, OR (US);
Abstract
Method and system for analyzing aircraft data, including multiple selected flight parameters for a selected phase of a selected flight, and for determining when the selected phase of the selected flight is atypical, when compared with corresponding data for the same phase for other similar flights. A flight signature is computed using continuous-valued and discrete-valued flight parameters for the selected flight parameters and is optionally compared with a statistical distribution of other observed flight signatures, yielding atypicality scores for the same phase for other similar flights. A cluster analysis is optionally applied to the flight signatures to define an optimal collection of clusters. A level of atypicality for a selected flight is estimated, based upon an index associated with the cluster analysis.