The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 30, 2005
Filed:
Jan. 31, 2003
Qiang LI, Clarendon Hills, IL (US);
Kunio Doi, Willowbrook, IL (US);
University of Chicago, Chicago, IL (US);
Abstract
A method, system, and computer program product for evaluating an image including an object, including filtering image data derived from the image with a first geometric enhancement filter having magnitude and likelihood filter components so as to produce first filtered image data in which a first geometric pattern is enhanced. Thereafter the filtered image data can be subjected to processing to derive a measure indicative of the presence of the object in the image, including determining a region of interest in the image, extracting at least one feature from the first filtered image data from within the region of interest, and applying the at least one extracted feature to a classifier configured to output the measure indicative of the presence of the object in the image. The image data can also be subjected to filtering with second and/or third geometric filters which enhance different geometric patterns, and which produce respective filtered data which are also processed to derive the measure indicative of the presence of the object.