The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 30, 2005
Filed:
Nov. 28, 2000
Tomoyuki Miyashita, Tokyo, JP;
Tomoyuki Miyashita, Tokyo, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
An average of pattern scores of a target binary image is obtained based upon the target binary image and first principal component vectors of a reference pattern, and the average of pattern scores of the target binary image is compared with a reference-pattern score that is based upon a sum total of distances between the first principal component direction of the reference pattern and a standard vector. Feature vector space of the target binary image is translated in accordance with the result of the comparison and access control information to be embedded in the target binary image, and an image is formed upon altering the target binary image based upon the result obtained by translating the feature vector space.