The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 30, 2005

Filed:

Jun. 19, 2000
Applicants:

Yatin R. Acharya, Sunnyvale, CA (US);

Philip J. Keller, Fremont, CA (US);

Matthew J. Fischer, Mountainview, CA (US);

Inventors:

Yatin R. Acharya, Sunnyvale, CA (US);

Philip J. Keller, Fremont, CA (US);

Matthew J. Fischer, Mountainview, CA (US);

Assignee:

Advanced Micro Devices, Inc., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04J003/14 ;
U.S. Cl.
CPC ...
Abstract

A method of testing a network physical layer device (PHY) having a media independent interface (MII) includes sending information between the PHY and a tester along the data buses of the MII. The information may be sent in the form of special frames, the special frames being sent from the tester to the PHY including an identifier. The PHY includes means for detecting the identifier, for extracting control information from the special frames, and for using the control information to execute write operations to and read operations accessing the memory registers of the PHY, and for sending information to the tester. The information may be passed between the PHY at an exemplary rate of 100 Mb/sec.


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