The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 30, 2005
Filed:
Feb. 27, 2002
Ryoheita Hattori, Machida, JP;
Naoyuki Kagami, Fujisawa, JP;
Tetesuya Kokubo, Fujisawa, JP;
Nobuya Matsubara, Fujisawa, JP;
Kaoru Umemura, Fujisawa, JP;
Ryoheita Hattori, Machida, JP;
Naoyuki Kagami, Fujisawa, JP;
Tetesuya Kokubo, Fujisawa, JP;
Nobuya Matsubara, Fujisawa, JP;
Kaoru Umemura, Fujisawa, JP;
Hitachi Global Storage Technologies Netherlands B.V., Amsterdam, NL;
Abstract
In addition to the conventional test pattern writing in a center of each track and inspection of burst patterns (A and B patterns) through a writing test in a SAT, there is also performed a test pattern data writing test, which is done at each boundary between tracks. With this additional test, it is possible to accurately inspect both C and D burst patterns that are sensitive to a PES signal at each boundary between tracks.