The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 30, 2005
Filed:
Jan. 27, 2004
Hiroshi Akiyama, Tokyo, JP;
Kazutoshi Takagi, Tokyo, JP;
Hiroshi Akiyama, Tokyo, JP;
Kazutoshi Takagi, Tokyo, JP;
Kabushiki Kaisha Topcon, Tokyo, JP;
Abstract
An operation microscope apparatus includes: an operation microscope () supported to a pillar through an electrically-operated elevating device for rough-motion (first upward-and-downward micro motion device); a lens support arm () supported to a support portion of the operation microscope () so as to be movable between a use position at which the lens support arm () is extended downward and a storage position at which the lens support arm () is stored upward; a front lens () held by the lens supported arm (); a control unit for controlling the electrically-operated elevating device (arithmetic and control circuit); a switch for upward-and-downward rough-motion (or); and a detection unit for detecting a storage state of the lens support arm () to output a detection signal (microswitch). In the apparatus, only when the detection signal is received, the control unit (arithmetic and control circuit) controls the electrically-operated elevating device (first electrical upward-and-downward micro motion device) by operating the switch (or) to allow the operation microscope () to roughly move upward and downward.