The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 30, 2005

Filed:

Jun. 15, 2004
Applicants:

Yoshinori Hayashi, Tokyo, JP;

Seizo Suzuki, Tokyo, JP;

Atsushi Kawamura, Tokyo, JP;

Hiromichi Atsuumi, Tokyo, JP;

Kohji Sakai, Tokyo, JP;

Akihisa Itabashi, Tokyo, JP;

Inventors:

Yoshinori Hayashi, Tokyo, JP;

Seizo Suzuki, Tokyo, JP;

Atsushi Kawamura, Tokyo, JP;

Hiromichi Atsuumi, Tokyo, JP;

Kohji Sakai, Tokyo, JP;

Akihisa Itabashi, Tokyo, JP;

Assignee:

Ricoh Company, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B026/08 ;
U.S. Cl.
CPC ...
Abstract

An optical system includes three optical systems. The first has a coupling lens. The second includes a lens having a positive power in a vertical scanning direction and forms the light flux into a line image extending in the horizontal scanning direction on a deflector. The third includes a first lens having a positive power in the horizontal scanning direction, and a second lens having a positive power in the vertical scanning direction. Lateral magnification in the horizontal scanning direction is set larger than that in the vertical scanning direction. Temperature near the first lens is maintained higher than that near the second lens.


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