The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 30, 2005
Filed:
Aug. 13, 2001
Yasufumi Fukuma, Tokyo, JP;
Takeyuki Kato, Tokyo, JP;
Yasufumi Fukuma, Tokyo, JP;
Takeyuki Kato, Tokyo, JP;
Kabushiki Kaisha TOPCON, Tokyo, JP;
Abstract
A refractive power measuring method is disclosed wherein a pattern plateis disposed at a certain position in a measuring optical path in a measuring optical system, a measuring light emitted from a measuring light sourceis received by a photosensorthrough the pattern plate, a soft contact lens TL is disposed at a certain position in the measuring optical path, and a change of a pattern light received by the photosensoris obtained to determine optical characteristic values of the soft contact lens. According to this method, the soft contact lens TL is disposed in a wet state at a certain position of the measuring optical path and scattered light resulting from scatter of the measuring light on a surface of the soft contact lens TL is received by the photosensor, then a state of scatter of the scattered light is determined from a change of a received light signal outputted from the photosensorand there are obtained optical characteristic values when the received light signal is below a preset value.