The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 30, 2005
Filed:
Jul. 19, 2000
Jane Chi Ya Cheng, Bridgewater, NJ (US);
Michael Alan Steckel, Bethlehem, PA (US);
Charles Morris Smith, West University Place, TX (US);
William Alois Weber, Burlington, NJ (US);
Stephen Harold Brown, Pennington, NJ (US);
Ajit Bhaskar Dandekar, Marlton, NJ (US);
Michael Alan Better, Kingwood, TX (US);
Jane Chi Ya Cheng, Bridgewater, NJ (US);
Michael Alan Steckel, Bethlehem, PA (US);
Charles Morris Smith, West University Place, TX (US);
William Alois Weber, Burlington, NJ (US);
Stephen Harold Brown, Pennington, NJ (US);
Ajit Bhaskar Dandekar, Marlton, NJ (US);
Michael Alan Better, Kingwood, TX (US);
ExxonMobil Chemical Patents, Inc., Houston, TX (US);
Abstract
The present invention provides a process for producing a monoalkylated aromatic compound, particularly cumene, comprising the step of contacting a polyalkylated aromatic compound with an alkylatable aromatic compound under at least partial liquid phase conditions and in the presence of a transalkylation catalyst to produce the monoalkylated aromatic compound, wherein the transalkylation catalyst comprises a mixture of at least two different crystalline molecular sieves, wherein each of said molecular sieves is selected from zeolite beta, zeolite Y, mordenite and a material having an X-ray diffraction pattern including d-spacing maxima at 12.4±0.25, 6.9±0.15, 3.57±0.07 and 3.42±0.07 Angstrom.