The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 30, 2005

Filed:

Feb. 08, 2001
Applicants:

Damian Hajduk, San Jose, CA (US);

Eric Carlson, Palo Alto, CA (US);

J. Christopher Freitag, Santa Clara, CA (US);

Oleg Kolosov, Cupertino, CA (US);

James R. Engstrom, Ithaca, NY (US);

Adam Safir, Berkeley, CA (US);

Ravi Srinivasan, Mountain View, CA (US);

Leonid Matsiev, San Jose, CA (US);

Inventors:

Damian Hajduk, San Jose, CA (US);

Eric Carlson, Palo Alto, CA (US);

J. Christopher Freitag, Santa Clara, CA (US);

Oleg Kolosov, Cupertino, CA (US);

James R. Engstrom, Ithaca, NY (US);

Adam Safir, Berkeley, CA (US);

Ravi Srinivasan, Mountain View, CA (US);

Leonid Matsiev, San Jose, CA (US);

Assignee:

Symyx Technologies, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N031/00 ; G01N003/00 ; G01N003/08 ;
U.S. Cl.
CPC ...
Abstract

An apparatus and method for screening combinatorial libraries of materials by measuring the response of individual library members to mechanical perturbations is described. The apparatus generally includes a sample holder for containing the library members, an array of probes for mechanically perturbing individual library members, and an array of sensors for measuring the response of each of the library members to the mechanical perturbations. Library members undergoing screening make up a sample array, and individual library members constitute elements of the sample array that are confined to specific locations on the sample holder. During screening, the apparatus mechanically perturbs individual library members by displacing the sample array (sample holder) and the array of probes. Typically, all of the elements of the sample array are perturbed simultaneously, but the apparatus also can also perturb individual or groups of sample array elements sequentially. The flexible apparatus and method can screen libraries of materials based on many different bulk physical properties, including Young's modulus (flexure, uniaxial extension, biaxial compression, and shear); hardness (indentation), failure (stress and strain at failure, toughness), adhesion (tack, loop tack), and flow (viscosity, melt flow indexing, and rheology), among others.


Find Patent Forward Citations

Loading…