The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 30, 2005

Filed:

Nov. 29, 2002
Applicants:

John Jun Zhang, Waukesha, WI (US);

Xianfeng NI, Waukesha, WI (US);

Eric Nicholas Stepanovich, Pewaukee, WI (US);

Renuka Uppaluri, Pewaukee, WI (US);

Manfred David Boehm, Waukesha, WI (US);

Inventors:

John Jun Zhang, Waukesha, WI (US);

Xianfeng Ni, Waukesha, WI (US);

Eric Nicholas Stepanovich, Pewaukee, WI (US);

Renuka Uppaluri, Pewaukee, WI (US);

Manfred David Boehm, Waukesha, WI (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01D018/00 ;
U.S. Cl.
CPC ...
Abstract

A digital radiographic imaging system includes an offset table for determining mechanical and structural offsets which would, if not corrected, misalign the source and detector during use. The method can correct for inaccuracies in mechanical linkages, examination rooms and other mounting structures, and 'drift' induced during use of the system.


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