The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 30, 2005

Filed:

Sep. 29, 2003
Applicant:

Graham D. Wall, Peterborough, CA;

Inventor:

Graham D. Wall, Peterborough, CA;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N029/04 ; G01S015/00 ;
U.S. Cl.
CPC ...
Abstract

A method for processing echoes in a time-of-flight ranging system or level measurement system. The method comprises applying an entropy filter to the echo profile. The entropy filter comprises determining the information content in the echo profile. The entropy filter determines the occurrences of a pattern in the bit stream representing magnitudes in the echo profile. Repeated occurrences of the pattern are used to characterize the echo signal as having low randomness (i.e. higher information content) indicative of a potential echo pulse or as having high randomness (i.e. lower information content) indicative of noise.


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Wall, Graham. (2005). Method for an entropy filter echo processing in time-of-flight or level measurement systems (U.S. Patent No. 6935177). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6935177

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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