The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 23, 2005
Filed:
Mar. 16, 2001
Keith R. Jones, Ramona, CA (US);
William W. Jones, San Diego, CA (US);
Ragnar H. Jonsson, Raykjavik, IS;
Keith R. Jones, Ramona, CA (US);
William W. Jones, San Diego, CA (US);
Ragnar H. Jonsson, Raykjavik, IS;
Mindspeed Technologies, Inc., Newport Beach, CA (US);
Abstract
A method and system for performing sequence time domain reflectometry to determine the location of line anomalies in a communication channel is disclosed. In one embodiment, the system generates a sequence signal and transmits the sequence signal over a channel that is the subject of the sequence time domain reflectometry analysis. The system monitors for and receives one or more reflections, collectively a reflection signal, and presents the reflection signal to a reflection processing module. In one embodiment, the reflection signal is correlated with the original sequence signal to generate a correlated signal. The system may perform signal analysis on the correlated signal to determine a time value between the start of the reflection signal and the subsequent points of correlation. Based on the time value and the rate of propagation of the signals through the channel, the reflection processing module determines a distance to a line anomaly.