The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 23, 2005
Filed:
May. 17, 2001
Yoshiaki Ichikawa, Tokai, JP;
Akira Sekine, Hitachiohta, JP;
Takako Oono, Hitachinaka, JP;
Hirotaka Satou, Hitachi, JP;
Tetsuya Matsui, Hitachi, JP;
Yoshiaki Ichikawa, Tokai, JP;
Akira Sekine, Hitachiohta, JP;
Takako Oono, Hitachinaka, JP;
Hirotaka Satou, Hitachi, JP;
Tetsuya Matsui, Hitachi, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
The present invention provides a method and system for management of chemical materials comprising the steps of providing a first data set containing which substances comprise the materials, providing a second data set containing which of the substances are to be controlled, providing a third data set containing a ratio of discharge of the controlled substances in a process, analyzing a preset amount of the materials in the process and determining a quantity of the controlled substances utilizing the first and second data sets, determining an emissions quantity of the controlled substances utilizing the ratio and the quantity of the controlled substances and maintaining the third data set according to a preset interval of time.