The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 23, 2005
Filed:
Mar. 20, 2002
Edward B. Gindele, Rochester, NY (US);
Navid Serrano, Rochester, NY (US);
Jeffrey C. Snyder, Fairport, NY (US);
Edward B. Gindele, Rochester, NY (US);
Navid Serrano, Rochester, NY (US);
Jeffrey C. Snyder, Fairport, NY (US);
Eastman Kodak Company, Rochester, NY (US);
Abstract
A method for estimating a noise characteristic value for a plurality of digital images that are affected by a common noise source includes receiving a plurality of source digital images that are affected by a common noise source, each source digital image including a plurality of pixels; calculating a total number of pixels included in the source digital images; and receiving a predetermined target number of noise estimates to be calculated for the source digital images. The method also includes using the total number of pixels and the predetermined target number of noise estimates to calculate one or more pixel sampling parameters for the source digital images; using the source digital images and the one or more pixel sampling parameters to calculate a predetermined number of noise estimates; and using the noise estimates to calculate a noise characteristic value for the source digital images.