The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 23, 2005

Filed:

Nov. 30, 2001
Applicant:

Hiroaki Ueno, Kawasaki, JP;

Inventor:

Hiroaki Ueno, Kawasaki, JP;

Assignee:

Fujitsu Limited, Kawasaki, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B027/36 ;
U.S. Cl.
CPC ...
Abstract

Method of accurately measuring various kinds of non-linear transition shifts (NLTSs) in the magnetic recording/reproduction using an MR-type reproducing head is provided. According to the method, the data of a reference bit-string pattern are sent, as reference signals, to a magnetic diskvia a head ICand a magnetic headso as to be magnetically recorded. A first predetermined harmonic component Vnref is measured from the reproduced signals of the record data detected by the magnetic heada bit-string pattern is selected from plural kinds of predetermined bit-string patterns, the data of the selected bit-string pattern are sent, as to-be-measured signals, to the magnetic diska second predetermined harmonic component Vnpat is measured from the reproduced signals, and the NLTS is calculated from Vnref and Vnpat.


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