The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6933953 B1

PDF
Full Text
Expired
Date of Patent:
Aug. 23, 2005

Filed:

Apr. 22, 2002
Applicant:

Nehal Dantwala, Peekskill, NY (US);

Inventor:

Nehal Dantwala, Peekskill, NY (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G09G005/00 ;
U.S. Cl.
CPC ...
Abstract

A system and method for selecting an enhancement vector for a plurality of enhancement functions using a cost function. A sharpness enhancement system is described that receives an input picture and outputs an enhanced picture, the sharpness enhancement system comprising: a plurality of enhancement functions that enhance the input picture; and a picture quality analyzer that selects an enhancement vector for the plurality of enhancement functions, wherein the enhancement vector is selected from a set of vectors based on a cost function that comprises: (1) a gradient analysis, and (2) a dynamic range analysis.


Find Patent Forward Citations

Dantwala, Nehal. (2005). Cost function to measure objective quality for sharpness enhancement functions (U.S. Patent No. 6933953). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6933953

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