The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 23, 2005
Filed:
Mar. 02, 2004
Amit Premy, Guna, IN;
Ganesan Thiagarajan, Bangalore, IN;
Amit Premy, Guna, IN;
Ganesan Thiagarajan, Bangalore, IN;
Texas Instruments Incorporated, Dallas, TX (US);
Abstract
Testing of a mixed signal integrated circuit (IC) potentially in the form of a die using a tested/calibrated integrated circuit. In an embodiment, the mixed signal IC generates an analog signal from a symbol, and transmits the analog signal to the calibrated integrated circuit. The calibrated IC determines a valid symbol corresponding to the signal level (e.g., voltage) of the received analog signal, and determines a deviation of the signal level of the received analog signal from the voltage level corresponding to the valid symbol. The deviation is deemed to represent the degree of defect of the mixed signal IC based on the assumption that the calibrated IC operates accurately. The deviation is used to either discard or qualify/accept the mixed signal IC.