The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 23, 2005
Filed:
Dec. 11, 2001
Weiguo Zhang, Foster City, CA (US);
Weiguo Zhang, Foster City, CA (US);
Toshiba America MRI, Inc., Tustin, CA (US);
Abstract
An improved magnetic resonance imaging (MRI) methodology uses an abbreviated initial MRI sequence to generate sequence diagnostic parameters. The sequence diagnostic parameters have a fixed relationship to certain sequence-conditioning parameters, and are used for calculating characteristic values of the sequence-conditioning parameters. The read out gradient pulse sequence is modified in accordance with the calculated characteristic values of the sequence-conditioning parameters. The modified read out gradient pulse sequence is then incorporated into a subsequent MRI pulse sequence used for obtaining a diagnostic image. The methodology has particular application in so called ultra fast MRI process which include echo-planar imaging (EPI) and echo-volume imaging (EVI).