The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 23, 2005
Filed:
Jul. 03, 2000
Nevio Vidovic, Kållered, SE;
Martin Krantz, Västra Frölunda, SE;
Svante Höjer, Kungälv, SE;
Thorleif Josefsson, Partille, SE;
Nevio Vidovic, Kållered, SE;
Martin Krantz, Västra Frölunda, SE;
Svante Höjer, Kungälv, SE;
Thorleif Josefsson, Partille, SE;
Samba Sensors AB, Gothenburg, SE;
Abstract
The invention relates to a method for optical measuring systems, comprising a sensor element () connected to a measuring and control unit () via an optical connection (), and being adapted for providing a signal defining a measurement of a physical parameter (p) influencing the sensor element (), said method comprising generation of a measuring signal that is brought to come in towards the sensor element (), and detection of the intensity of the measuring signal (B) in the measuring and control unit (), after influencing the measuring signal in the sensor element (). The invention is characterised by comprising partial reflection of the measuring signal at a point along the optical connection (), at a predetermined distance from the sensor element (), detection of the intensity of the signal (A), corresponding to said partially reflected measuring signal, and determination of a measurement of said parameter (p) based upon the intensity of the partially reflected signal (A) and the intensity of the measuring signal (B). The invention also relates to a device for carrying out said method. Through the invention, measurements with an optical pressure measuring system are allowed, which exhibit effective compensation for any existing sources of error.