The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 23, 2005
Filed:
Apr. 23, 2002
Lutz Parthier, Berlin, DE;
Frank-thomas Lentes, Bingen, DE;
Gunther Wehrhan, Jena, DE;
Burkhard Speit, Jena, DE;
Hans-joerg Axmann, Jena, DE;
Lutz Parthier, Berlin, DE;
Frank-Thomas Lentes, Bingen, DE;
Gunther Wehrhan, Jena, DE;
Burkhard Speit, Jena, DE;
Hans-Joerg Axmann, Jena, DE;
Schott Glas, Mainz, DE;
Abstract
In the method and apparatus for measuring the position of the phase interface during growth of a crystal from a melt in a crystal growth container according to the VGF method an incident optical signal is propagated to the phase interface between the melt and the crystal through a window () in the container () and a received optical signal reflected from the phase interface () is measured to determine the position of the phase interface. The position of the phase interface is established from the reflected signal by triangulation with a confocal optic system, by interferometric balancing or by transit time of the optical signal. The window () is preferably mounted in a preferably tilted orientation at the end of a tube (), which is immersed in the melt ().