The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 23, 2005
Filed:
May. 01, 2002
Vasyl V. Molebny, Kiev, UA;
Ioannis Pallikaris, Heraklion Crete, GR;
Igor Chyzh, Kiev, UA;
Vyacheslav Sokurenko, Kiev, UA;
Leonidas Naoumidis, Heraklion Crete, GR;
Youssef Wakil, Houston, TX (US);
Vasyl V. Molebny, Kiev, UA;
Ioannis Pallikaris, Heraklion Crete, GR;
Igor Chyzh, Kiev, UA;
Vyacheslav Sokurenko, Kiev, UA;
Leonidas Naoumidis, Heraklion Crete, GR;
Youssef Wakil, Houston, TX (US);
Tracey Technologies, L.L.C., Houston, TX (US);
Abstract
An instrument for measuring aberration refraction of an eye is provided, having: a lens system defining an instrument optical axis and an alignment device for aligning the visual axis of the eye with the instrument optical axis. A light source () produces a probing beam that is projected through the lens system parallel to the instrument optical axis and is selectably positionable partially off-set from the instrument optical axis for entering the eye () parallel to the instrument optical axis at a plurality of locations on the cornea of the eye. A photodetector () measures the position of probing beam light scattered back from the retina of the eye to measure aberration refraction of the eye at a plurality of locations.